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Uncooled Infrared Detectors
LWIR Uncooled Thermal Module 384x288 17μM For Medical Thermal Image Screening

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xResolution | 384x288 | Power Consumption | 0.85W |
---|---|---|---|
Spectral Range | 8~14μm | Pixel Pitch | 17μm |
Typical NETD | <50mk | Frame Rate | 25Hz |
Highlight | Medical LWIR Uncooled Thermal Module,Uncooled Thermal Module 384x288,17uM Thermal Image Camera Module |
LWIR 384x288/17μM Uncooled Thermal Module For Medical Thermal Image Screening
iHA417W thermal module is specially developed for medical diagnosis. The captured temperature data and heat distribution of target can be used to achieve radiation-free, non-invasive early disease diagnosis and long-distance, large-scale body temperature screening.
It is mainly composed of wafer-level-packaging 384×288/17μm infrared detector, optical lens and SDK for temperature measurement with accuracy up to ±0.5℃.
Without external black body, the iHA417W thermal imaging module has a compact & light structure, which guarantees a lower integration cost. It has two modes of detect distance: 0.5m (for medical diagnosis) and 5m (for epidemic prevention and animal thermography).
iHA417W thermal camera module has an all-in-one standard Type-C interface with power supply, data transmission and control, customers can quickly develop and integrate various temperature measuring systems like medical diagnosis and epidemic prevention.
- Small Size: 25.4mm×25.4mm×30.3mm (with lens)
- Typical NETD<50mk
- Detect Distance: 0.5m/5m
- Light Weight as Low as 32.2g
- Superior Temperature Measurement Accuracy: ±0.5℃
Model | iHA417W |
IR Detector Performance | |
Resolution | 384×288 |
Pixel Size | 17μm |
Spectral Range | 8~14μm |
Typical NETD | <50mk |
Image Processing | |
Frame Rate | 25Hz |
Start-up Time | 5s |
Digital Video | RAW/YUV |
Image Display | Black Hot/White Hot/Pseudo Color |
Image Algorithm | NUC/3DNR/DNS/DRC/EE/SFFC |
Electrical Specification | |
Standard External Interface | Type-C |
Communication Mode | USB |
Supply Voltage | 5±0.5V |
Typical Power Consumption | 0.85W |
Temperature Measurement | |
Operating Temperature Range | -10°C ~ +50°C |
Temperature Measurement Range | 15℃ ~ 50℃ |
Temperature Measurement Accuracy | ≤±0.5℃ (No wind indoor, target temperature range 32℃~42℃) |
Measuring Distance | Two Modes: 0.5m or 5m |
SDK | Support Windows/Android/Linux SDK, Achieve Full Screen Thermography |
Physical Characteristics | |
Size (mm) | ≤25.4×25.4×30.3 (With 9.1mm Lens) |
Weight | 32.2±3g (With 9.1mm Lens) |
Environmental Adaptability | |
Operating Temperature | -40°C ~ +70°C |
Storage Temperature | -45°C ~ +85°C |
Humidity | 5%~95%, non-condensing |
Vibration | Random Vibration 5.35grms, 3 Axis |
Shock | Half-sine Wave, 40g/11ms, 3 Axis 6 Direction |
Optics | |
Optional Lens | Fixed Focus Athermal: 9.1mm |
Certificate | |
Standard | ROHS/REACH |
The iHA417 thermal module is expected to be widely used in the fields of Disease Screening, Traditional Chinese Medicine Physiotherapy, Health Check-up, Rehabilitation etc. at present and in the future.
1. What is the difference between uncooled and cooled IR detectors?
There are currently two types of infrared thermal imaging sensors on the market, cooled and uncooled.
Uncooled IR detector operates at ambient temperature. It is based on semi-conductor industry and thus usually can be fabricated in big volume with small size and low cost. Uncooled IR detectors are widely used in portable/handheld/mobile devices.
Cooled IR detectors are packaged in a unit that keeps them at an extremely low temperature which shall be supported by a cryo cooler. They are much bigger, more expensive and less reliable than uncooled sensors, mainly due to the complex cooling systems they require. However, the cooled systems are incredibly sensitive and usually work with long focal length optics to achieve long range mission.
2. About Wafer Level Packaging Infrared Detector
Wafer-level packaging, also known as wafer-level size packaging, has become an important part of advanced packaging technology in the semiconductor industry. Wafer level packaging (WLP) is the process of completing high vacuum packaging directly on the entire MEMS wafer, then scribing and cutting to make a single infrared detector. It performs most or all of the packaging and testing procedures directly on the IR detector wafer before dicing.
It is an improved chip size package that meets the needs of small size, lightweight, portable, handheld, low price and high production efficiency.